
| Name | Value |
|---|---|
| NAME | 6640-239272 |
| LIFE EXPECTANCY | 10 |
| BRIEF DESCRIPTION | PROB SYS ELEC MICRSMP |
| NOMENCLATURE | PROBE SYSTEM, ELECTRON CHARGED MICROSAMPLES. A SYSTEM DESIGNED TO MEASURE THE ELEMENT CONTENT OF MICROSAMPLES, I.E. THE ION CONCENTRATION IN CELLS AND CELL COMPONENTS. CONSISTS, BASICALLY, OF AN ELECTRON MICROSCOPE, WITH A BUILT-IN X-RAY SPECTROMETER THAT DOES THE DETECTING OR SCANNING OF THE X-RAY CHARACTERISTICS OF EACH ELEMENT IN THE ELECTRON CHARGED MICROSAMPLES. |